Intel® SSD 750 Series

Launch Date

The date the product was first introduced.

Sequential Read (up to)

Speed with which the device is able to retrieve data that forms one contiguous, ordered block of data. Measured in MB/s (MegaBytes per Second)

Sequential Write (up to)

Speed with which the device is able to record data into one contiguous, ordered block of data. Measured in MB/s (MegaBytes per Second)

Random Read (8GB Span) (up to)

Speed with which the SSD is able to retrieve data from arbitrary locations in the memory, within 8GB of LBA (Logical Block Address) range on the drive. Measured in IOPS (Input/Output Operations Per Second)

Random Write (8GB Span) (up to)

Speed with which the SSD is able to record data to arbitrary locations in the memory, within 8GB of LBA (Logical Block Address) range on the drive. Measured in IOPS (Input/Output Operations Per Second)

Latency - Read

Read Latency indicates the elapsed time to execute a data retrieval task. Measured in micro-seconds.

Latency - Write

Write Latency indicates the elapsed time to execute a data record task. Measured in micro-seconds.

Power - Active

Active Power indicates typical power consumption of the device when operating.

Power - Idle

Idle Power indicates typical power consumption of the device when idle.

Vibration - Operating

Operating Vibration indicates the tested capability of the SSD to withstand the reported vibration in the operating state and remain functional. Measured in G-force RMS (Root Mean Square)

Vibration - Non-Operating

Non-Operating Vibration indicates the tested capability of the SSD to withstand the reported vibration in the non-operating state and remain functional. Measured in G-force RMS (Root Mean Square)

Shock (Operating and Non-Operating)

Shock indicates the tested capability of the SSD to withstand the reported shock in both operating and non-operating states and remain functional. Measured in G-force (Max)

Endurance Rating (Lifetime Writes)

Endurance rating indicates the expected data storage cycles to be expected over the life of the device.

Mean Time Between Failures (MTBF)

MTBF (Mean Time Between Failures) indicates the expected elapsed operating time between failures. Measured in hours.

Uncorrectable Bit Error Rate (UBER)

Uncorrectable Bit Error Rate (UBER) indicates the number of uncorrectable bit errors divided by the total number of transferred bits during a tested time interval.

Form Factor

Form factor indicates the industry standard size and shape of the device.

Interface

Interface indicates the industry standard bus communication method employed by the device.

Enhanced Power Loss Data Protection

Enhanced Power Loss Data Protection prepares the SSD for unexpected system power loss by minimizing data in transition in temporary buffers, and uses on-board power-loss protection capacitance to provide enough energy for the SSD firmware to move data from the transfer buffer and other temporary buffers to the NAND, thus protecting system and user data.

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High Endurance Technology (HET)

High Endurance Technology (HET) in SSD's combines Intel® NAND Flash Memory silicon enhancements and SSD system management techniques to help extend the endurance of the SSD. Endurance is defined as the amount of data that can be written to an SSD during its lifetime.

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Temperature Monitoring and Logging

Temperature Monitoring and Logging uses an internal temperature sensor to monitor and log airflow and device internal temperature. The logged results can be accessed using the SMART command.

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End-to-End Data Protection

End-to-End Data Protection ensures integrity of stored data from the computer to the SSD and back.

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Intel® Smart Response Technology

Intel® Smart Response Technology combines the fast performance of a small solid state drive with the large capacity of a hard disk drive.

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Intel® Rapid Start Technology

Intel® Rapid Start Technology allows quick system resumes from the hibernate state.

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